Delphi X Observer Metallurgical


  • Brightfield and Darkfield illumination
  • Enhanced infinity corrected EIS optical system
  • Full Apo, Semi- Apo and Plan EIS objectives
  • 100 W halogen illumination
  • Many ergonomic solutions
  • Normarski DIC (optional)
  • High contrast objectives with minimal abberations
  • Super Wide field SWF 10x/25mm eyepieces
  • Sextuple reversed nosepiece with slot for DIC


Delphi X Observer Metallurgical

30 degree Siedentopf head
tilting head
10x/25 mm eyepieces
Plan EIS 2x/0.06 objective* Plan Semi-Apochromatic EIS
5x/0.15, 10x/0.30 and 20x/0.45 objectives*
Plan Apochromatic
EIS 50x/0.80 objective*
Plan Apochromatic
EIS 100x/0.90 objective*
100 W 24 V transmitted
halogen Köhler illumination
100 W 24 V reflected
halogen Köhler illumination
interference Contrast (DIC)
DX.2053‑PLMRi o o o  
DX.2058‑PLMRi o o o  
DX.2053‑PLMi o o o
DX.2058‑PLMi o o o

* Infinity corrected
o = optional


• Super Wide field SWF 10x/25 mm, Ø 30 mm tubes
• Extended Wide Field EWF 10x/22 mm, Ø 30 mm tubes (optional)

Siedentopf trinocular with 30° inclined tubes. Interpupillary distance adjustable between 47 and 78 mm. The trinocular standard head has an optical path selector (100:0 / 80:20 / 0:100). Diopter adjustment on both eyepieces

Optional ergonomic 0 to 35° tilting trinocular head supplied with SWF 10x/25 mm eyepieces, interpupillary distance between 47-78 mm and photo tube with standard Ø 23.2 mm tube. The trinocular tilting head has an optical path selector (100:0 / 80:20 / 0:100). Diopter ± 5 adjustments on both eyepieces

Revolving sextuple reversed nosepiece on ball-bearings with 25 mm objectives mounting threads

The enhanced infinity system (EIS) of the Delphi-X Observer™ consists of Super wide field SFWF 10x25 mm eyepieces, high numerical aperture 45 mm parafocal objectives and a 200 mm focal length tube lens. The 200 mm focal length tube lens reduces the angle of the light rays passing through the optics and as a direct result improving significantly the chromatic aberration corrections and contrast. The objectives with larger diameter enable much higher numerical apertures improving the overall resolving power of the optical system

For all these reasons the Delphi-X Observer™ offers superior optical performance for the most demanding applications

The Delphi-X Observer™ is standardly supplied with Plan Semi-Apochromatic EIS 5x/0.15 WD 20 mm, 10x/0.30 WD 11 mm and 20x/0.45 WD 3.1 mm Plan Apochromatic EIS 50x/0.80 WD 1 mm, 100x/0.90 WD 1 mm objectives infinity corrected EIS objectives

Plan Semi-Apo (SAMi)




Plan Apo (PLAMi)



Plan (PLMi)


* Optional.
All objectives are 45 mm parafocal and have a M25 mm mounting thread

• Large 215 x 170 mm stage with 105 x 105 mm integrated right-handed mechanical stage
• Stage height can be changed to sample size or can be lowered by one inch for user ergonomics using the optional nose piece lowering attachment (DX.9887)

Nosepiece lowering attachment
The nosepiece lowering attachment lowers the height of the revolver with 40 mm which allows the stage to be used in the 40mm lower position as well (DX.9887)

Eye-level riser
The eye-level riser can raise the eye-point height by 25,4 mm at one time (DX.9885)

Coaxial coarse and fine adjustment, 100 graduations, 1 µm precision, 100 μm per rotation, total travel range is approximately 35 mm. Supplied with an adjustable rack stop to prevent damage to sample and objectives. The coarse adjustments are equipped with friction control. The focusing knobs can be switched from left to right according to the user’s preference

In height adjustable long working distance N.A. 0.65 condenser (10.2 mm) with numerical aperture identification marks allows easy setting

the Delphi-X Observer materials science microscope is equipped with Epi and Diascopic intensity adjustable 100 W halogen illumination with internal100-240 Vac power supply. The diascopic halogen illumination comes with two push-in/push-out neutral density filters for smooth attenuation of the light intensity for all kinds of samples

The microscope comes standard with a analyzer and a polarizer which can easily be inserted into the free slots into the Epi-Illuminator for high quality polarized images. Further a rotating cassette is implemented for quick changing between darkfield, brightfield and dimmed brightfield

NORMARSKI DIC (optional)
With the redesign of the DIC-module visualization of height differences which normally cannot be displayed using brightfield techniques has greatly improved. These relief like images are ideal for surface inspections of wafers, LCD screens etc

The unique iCare Sensor is developed to avoid unnecessary loss of energy. The illumination of the microscope automatically switches off shortly after microscopists step away from their position

The carrying grip at the back of the microscope ensures safe transportation of the microscope and the integrated tool and holder makes sure the right tool is always available

Supplied with power cord, dust cover, a spare fuse, user manual and universal tool. All packed in a polystyrene box